Fine Pitch Test
SKU
Fine Pitch Test
These probe pin products are used mainly for inspecting semiconductor wafers, and can deal with a pitch of up to 110 μm. Various plunger materials are available.
- Easy to modify probe pin specification (Tip shape, Length, Diameter, Spring Force, Material)
- Supports from small quantity to mass product.
- Supports probe specification evaluation
These probe pin products are used mainly for inspecting semiconductor wafers, and can deal with a pitch of up to 110 μm. Various plunger materials are available.
- Easy to modify probe pin specification (Tip shape, Length, Diameter, Spring Force, Material)
- Supports from small quantity to mass product.
- Supports probe specification evaluation