Burn in Board (BIB)
Types of Burn in Test Process
Static Burn In – A burn-in system applies extreme voltage or currents and temperatures to each device without operating or exercising the device.
Dynamic Burn In- the device is exposed to high voltage and temperature extremes while being subjected to various input stimuli .
TDBI (Test During Burn-In)- Test during burn-in systems monitor and apply test vectors to a device while it is undergoing burn-in stress.This method ensures that devices are being powered up and input tests are being applied as intended.
Types of Burn In Board Test
HAST Board (Higly Accelerated Stress Test) Board – HAST uses a high temperature (105°C), high relative humidity (about 85%), and high atmospheric pressure conditions (up to 4 atm).HAST test results are available within 96-100 hours.
THB Board (Temperature Humidity Bias) – THB holds 85°C/85% RH condition while bias loads are applied to the samples.THB test results are available within 1000 hours.
HTOL Board (High Temperature Operating Life) – used to determine the reliability of devices under operation at high temperature conditions over an extended period of time.It consists of subjecting the parts to a specified bias or electrical stressing, for a specified amount of time, and at a specified high temperature essentially just a long-term burn-in).
TC (Temperature cycling) – the units was subject to extreme high and low temperatures transitions between the two.The test is performed by cycling the unit’s exposure to these conditions for a predetermined number of cycles.
