High Frequency Test

These probe pin products are used for inspecting semiconductors with excellent RF characteristics that can tolerate high-speed devices, and their length has been reduced to 1.6 mm. Various plunger materials are available.

Easy to modify probe specification (Tip shape, Length, Diameter, Spring Force, Material)
Supports from small quantity to mass product.
Supports probe specification evaluation

Request a Quote

Semicon Product Enquiries
Name
Name
First Name
Last Name
Let us know the company or institution you're affiliated with
We'll use this to send your quotation and updates.

Our Top Products

Scroll to Top